Description
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Product Details
- Edition:
- 1.0
- Published:
- 02/20/2003
- Number of Pages:
- 11
- File Size:
- 1 file , 410 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
