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SAE J784A_197108 PDF

$96.00

Residual Stress Measurement by X-Ray Diffraction
standard by SAE International, 08/01/1971

Document Format: PDF

Description

Product Details

Published:
08/01/1971
Number of Pages:
124
File Size:
1 file , 8.9 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus

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